proteanTecs and Teradyne bring ML-driven telemetry to SoC testing

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proteanTecs, a leader in deep data analytics for advanced electronics, and Teradyne, a supplier of automated test solutions, has formed a strategic partnership to enhance semiconductor test and debug processes for advanced system-on-chips (SoCs).

By connecting proteanTecs’ on-chip agent data and analytics software with Teradyne’s test programmes, customers will be able to benefit from a new level of device visibility where they need it most — on the tester, for inline and real-time decisions.

The two companies are already engaged with mutual customers in mission-critical applications. Alphawave Semi, a specialist in high-speed connectivity, is for example using proteanTecs’ deep data analytics and Teradyne’s automated test solutions. By leveraging the combined workflow, Alphawave Semi was able to optimise their AVS flow to reach minimum possible voltage to operate their device which contains optical digital signal processing (DSP) technology acquired from Banias Labs.

“Teradyne is a leader in advanced test solutions, and their automated test equipment is widely used in markets where power, reliability and performance are critical,” said Uzi Baruch, Chief Strategy Officer at proteanTecs. “By integrating our cloud and edge solutions with Teradyne’s advanced test environment, customers will gain access to cutting-edge testing to meet the growing industry demands.”

“Ensuring optimal test coverage to validate increasing device quality requirements is vital,” said Regan Mills, Vice President and General Manager, Semiconductor Test at Teradyne. “proteanTecs’ analytics provide high-resolution, parametric data that drives faster and deeper device learning. Our partnership with proteanTecs is centred around a shared goal of accelerating our customers’ time to market and improving the end product’s performance, longevity and quality.”

The joint solution provides a simple method for retrieving data from on-chip Agents on a device under test (DUT) and reporting that data back to the user for real-time inference settings or up to the cloud for later processing.

This capability combined with advanced analytics and machine learning delivers insights from the chip, accurate outlier detection, personalised power optimisation, per-die grading, and increased test coverage.

proteanTecs’ solutions can be instantiated in Teradyne’s IG-XL software via the Teradyne PortBridge tool for use on Teradyne’s UltraFLEX and UltraFLEXplus testers.