Engineering publications brought to you by Mark Allen

Memory

Enhancing the capacity of memory devices

Samsung unveils first eMRAM test chip based on 28nm FD-SOI process

Cadence unveils memory design and verification tool

Microchip launches low-voltage 64-megabit serial quad I/O SuperFlash memory

Ideal memory material conceptualised

Researchers create magnetoelectric memory

Samsung introduces V-NAND memory solutions

Enterprise-Class SSDs come with 64-Layer 3D Flash Memory

Fluorine grants white graphene new powers

Benefits of common platforms for data acquisition

Toshiba develops 3D flash memory with TSV tech

Ad hoc cache hierarchies make chips more efficient