Tektronix unveils new solutions for 100G transceiver testing

1 min read

Tektronix has announced the 82A04B, a new phase reference module for the DSA8300 oscilloscope that can reduce instrument jitter to less than 100 femtoseconds when combined with new sampling modules.

The company says this represents the lowest instrument jitter of any multi channel oscilloscope on the market for design, debug and characterisation of critical 100G transmitters. "The new phase reference module, upgraded electrical sampling modules and other enhancements establish Tektronix as the clear leader in high speed data communications," said Brian Reich, general manager, performance oscilloscopes at Tektronix. "We offer customers significant advantages in measurement system fidelity, versatility and usability; all at very competitive price points." Designed for use with the DSA8300 mainframe, the 82A04B module supports input clock frequencies from 2 to 32GHz with an option available to support up to 60GHz. The six new sampling modules support bandwidths from 20 to 70 GHz and use remote sampling heads that place the measurement acquisition point at or near the device under test to minimise signal degradation due to cabling. The company says the DSA8300 can support simultaneous acquisition of up to three differential (or six single ended) signals with ultra low jitter for multi lane system testing common in today's 100G electrical designs.