Engineering publications brought to you by Mark Allen

Consumer

Dual sensor face recognition system

CSIT set to tackle cybercrime and antisocial behaviour

IBM dram test chip brings ‘three generation’ leap

Integrated rf ics for network infrastructure

ARM, NXP target rapid prototyping for mcus

Getting smarter

The integration imperative

Directives drive efficiency

Rohm opens European Design Centre

Threaded memory module deal

'unprecedented range' for wireless data transmission

XMOS signs Digi-Key distribution deal