Engineering publications brought to you by Mark Allen

Research Design

Under exposure

Rising to the acceleration challenge

Imagination unveils neural network accelerator

Samsung unveils first eMRAM test chip based on 28nm FD-SOI process

Metrology for nanotechnology

First commercial hardware acceleration of neuromorphic computing

Researchers develop advanced material for stable, high capacity rechargeable batteries

Leading companies in CCIX test chip collaboration

Leti unveils pressure-based fingerprint sensor

New sintering joining technology

Mechanical force to control thermoelectric voltage

Domain structure controlled in ferroelectric materials