Supporting what the company says is ‘an order of magnitude faster runtime’, TetraMAX II cuts automatic test pattern generation (ATPG) runtime to a matter of hours. Additionally, because the software generates 25% fewer patterns, design teams can cut the time and cost of testing devices.
TetraMAX II is built on new test generation, fault simulation and diagnosis engines that are optimised for generating patterns and capable of executing fine-grained multithreading of the ATPG and diagnosis processes. Improvements in memory efficiency allows server cores of all types to be used.
TetraMAX II also uses links with Synopsys’ Galaxy Design Platform tools to improve productivity.
Meanwhile, the software has been certified to comply with ISO26262 by SGS-TÜV Saar. This is said to provide designers with high levels of confidence when using the package in safety critical automotive applications.
Bijan Kiani, VP of marketing in Synopsys’ Design Group, noted: “For automotive IC applications, TetraMAX II provides the opportunity to increase test quality with multiple fault models, without significant impact to test costs and test generation time.”
