The SDS7000A provides 4 analogue channels and 16 digital channels, with bandwidths of 3GHz and 4GHz, expanding design applications to new test requirements.
The maximum sampling rate is 20GSa/s, the vertical resolution is 12-bit (by hardware), the standard acquisition memory depth is 500 Mpts per channel and this can be upgraded to 1 Gpts/ch. The noise floor is as low as 220μVrms at 4 GHz bandwidth. The waveform capture rate can go up to 1 million wfm/s, which speed up capturing abnormal events.
The Scope has a 15.6-inch high-definition touch screen, which offers increased space for analysing various signals simultaneously and helps to improve the developer’s efficiency.
The sampling rate of 20 GSa/s enables the capture of fast signal transitions with high fidelity. Each sample utilises the 12-bit ADC to limit the quantisation error, which can help engineers to observe the details of the waveform clearly and measure the waveform accurately.
With the long storage depth of up to 1 Gpts/ch, signal sequences for up to 50 milliseconds at max sampling rate can be captured without any gaps. By utilising search and navigate or history tools the analysis of the entire stored trace is made easier.
The processor of the SDS7000A has been fully upgraded. Utilising an X86 processor greatly improves the response speed, measurement, operation and analysis speed of the system, and creates more opportunities for future expansion of analysis functions.
As the core of signal integrity analysis of high-speed systems, eye diagrams characterise high speed communication signals. The quality of the system can be evaluated by observing the influence of inter-symbol crosstalk, noise, and bandwidth. Jitter analysis characterises the statistical distribution of small timing changes in a system and is often used to debug digital communication systems and high-speed signal transmission.
The SDS7000A series supports automatic parameter measurements for jitter and eye characterisation and easy setup and automatic measurements speed debugging and simplify engineering design testing.
With the SDS7000A, SIGLENT provides embedded compliance test solutions to evaluate systems versus communication standards including USB 2.0, 100base-TX, 1000base-T, 100base-T1 and 1000base-T1.
Users can flexibly configure the test items, and the software can control the oscilloscope to automatically complete the test, and automatically give the signal test results (Pass/Fail) after comparing with the reference standards. This helps to identify and resolve critical signal and transmission issues quickly.
The SAP5000D is SIGLENT’s highest performing active differential probe kit providing up to 5 GHz of bandwidth and low noise for detailed signal analysis. Its high input resistance and low input capacitance can ensure that the load introduced by the measurement system is minimised.
The SAP5000D active probe utilises the SAPBus interface, making it suitable for oscilloscopes including the SDS5000X, SDS6000A and SDS7000A series. These probes do not need an additional external power supply and are automatically recognised by the oscilloscope.