Measuring noise accurately in new electronic devices for use in IoT, 5G

2 min read

A new milestone in low-frequency noise measure has been announced by Keysight Technologies, which has been developed through its work with research centres in Europe, Middle East, Africa and India (EMEAI).

“Since introducing the advanced low-frequency noise analyser, Keysight has actively engaged with research centers that are world-renowned in the field of noise measurements,” Cédric Pujol, EMEAI device modeling business development manager for Keysight EEsof EDA, said. “These collaborations have driven our developments into a broad range of applications, allowing the analyser to increase its versatility in flicker-noise and random telegraph noise measurements. They also helped strengthen the use of the analyser for devices used in industrial electronics and in 5G and IoT-based devices.”

The Keysight A-LFNA is said to offer designers the flexibility to transform their low-frequency noise measurements into mathematical models.

Fraunhofer EMFT, Germany: “By controlling A-LFNA with WaferPro Express, we significantly improved our ability to set up sequences to characterise our extremely low-noise devices, while also gaining the flexibility to drive the whole measurement system effortlessly,” said Werner Muth, device development consultant to Fraunhofer EMFT in Munich. “The system can mathematically post-process our raw results in an automated way, allowing us to very quickly get insight into the noise figure improvement of our newly developed devices.”

LAAS-CNRS. France: “LAAS-CNRS has extensive and wide-ranging experience in the field of high and low-frequency noise measurements, with two low-frequency experimental setups currently available, 400mA max and 1Hz to 1MHz, as well as robust software for spectra extraction,” said Jean-Guy Tartarin, senior researcher at LAAS-CNRS. “With the new analyser solution proposed by Keysight within the framework of the Low-Frequency Noise European Centre, it will now be possible to address emerging challenges we face, like the number of samples and quiescent point under test. Using the automated solution, we’ll save both time and measurements.”

Researchers at Chalmers University are said to have found success with the new A-LFNA solution. Using the analyser, they claimed they were able to significantly improve the throughput of their high-quality, flicker noise measurements.

The A-LFNA has been designed with high-power capability, low noise floor and an ability to flexibly switch between voltage and current amplifier operation, enabling characterisation of different types of devices.

Other achievements are said to include the extension of the A-LFNA to enable noise measurements on CMOS sensors down to ultra-low frequencies (0.030 Hz) and on power devices with a 200-V bias voltage. In support of bulk silicon and silicon on insulator technologies, the A-LFNA also now asserts a state of the art noise floor (2E-27 A2/Hz). Additionally, it has been upgraded to measure noise power densities up to 40 MHz.

“I am pleased that Keysight’s 1/f measurement system and more broadly Keysight’s device modeling portfolio meets the needs of leading research centres in Europe,” said Thierry Locquette, Keysight EDA’s EMEAI sales manager. “The combination of a state of the art solution with strong local support is a significant differentiator.”