Source measurement unit offers ‘industry’s highest’ channel density
Designed for parallel testing multi pin semiconductor devices, National Instruments' PXIe-4143 is said to feature the highest channel density of any source measurement unit (SMU) on the market.
The PXIe-4143 has four channels with up to 600kS/s sampling rate to measure fast transient responses. Using the company's SourceAdapt technology, it allows engineers to custom tune the SMU response for any device under test (DUT) load.
The release of the device expands NI's multichannel SMU output range to 24V at 150mA. NI says the SMU can help reduce the cost of capital equipment, decrease test times and increase mixed signal flexibility for a variety of DUTs.
"With the new NI PXIe-4143, our SMU family now gives test engineers dc measurement options for almost any device," said Ron Wolfe, vp of semiconductor test at NI. "Our industry leading channel counts, superior sample rates and SourceAdapt technology for custom tuning provide one of the most flexible selections of semiconductor measurement instruments available."