Modular Solutions for Electronics NPI and Manufacturing Seminar

This free full day technical seminar will be delivered by Agilent Technologies' industry experts and partners. The PXI open-standard has seen rapid adoption in measurement and test automation applications, where compact form factor and modular channel expandability are required. PXI is used in many target applications in aerospace, military, automotive, digital, and wireless industries and domains. Seminar overview Reducing overall test time in high volume electronic manufacturing sites is critical to meeting manufacturing capacity and cost targets. Optimising throughput, while not sacrificing test coverage or production yield, is essential to retaining a competitive edge. Best in class manufacturers use statistical methods during test system development to achieve high throughput without compromising test coverage or test yields. During test system development, statistically based gauge reliability and repeatability studies are used to verify the stability of the test methods and test system. After establishing a reliable and repeatable test, methods to optimise throughput can be explored. The statistical methods can be used again to verify test throughput optimization will not impact test yields. Who should attend: • Engineers, Manager within the following sectors • Test engineers responsible for automated test • Aerospace and Defence • Automotive • Electronic test • Industrial Controls • Communications & Semi-conductor testing