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New Electronics
Software Safety – Where’s the Evidence?
SCSC
Events
05 Apr 2011
SourceMeter targets high power semiconductor test
Laura Hopperton
Product Launches
05 Apr 2011
‘Industry's first’ programmable metrology devices for analogue front end solutions
Laura Hopperton
Product Launches
05 Apr 2011
Nanomaterial can detect and neutralise explosives
Laura Hopperton
News
04 Apr 2011
New research could lead to improved semiconductor nanocrystals
Chris Shaw
News
04 Apr 2011
Smart tracking system learns to recognise faces
Chris Shaw
News
04 Apr 2011
Innovative technology opens door to bionic vision
Chris Shaw
News
04 Apr 2011
Circular connectors meet IP68 protection standards
Laura Hopperton
Product Launches
04 Apr 2011
New form factors address growth in printed sensor market
Chris Shaw
News
01 Apr 2011
Next gen WiMax standard approved by IEEE
Chris Shaw
News
01 Apr 2011
Researchers set new world record with 14 quantum bits
Laura Hopperton
News
01 Apr 2011
Automated schematic porting tool reduces problems of manual migration
Chris Shaw
News
01 Apr 2011
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