Test times of rf comms devices improved

Aeroflex has announced it will deliver a non-signaling PXI solution customised for rf production line test of Infineon's second generation mobile phone platform.

The solution, based on the Aeroflex PXI 3000 series, will test Infineon's second generation chipset X-Gold 101. According to Aeroflex, the key advantage of its PXI solution is its flexibility, which the company says contributes to lower test costs and faster test times.

The PXI 3000 series is able to test standards such as WLAN, CMA2000/1xEVDO, WiMAX, UMTS, GSM/EDGE, Bluetooth and LTE.
With the PXI 3000 series, the same hardware tests all the 2G, 3G and 4G and wireless data standards. Users can add software modules to customise the solution to meet their current and future rf testing needs.

The PXI 3000 series, says Aeroflex, achieves up to five times higher throughput than conventional instrumentation and is leading the market in terms of test speed. Its performance is the result of fast responding hardware and the use of multicore processors. Multicore processing through the inherently open software architecture helps engineers to perform multiple simultaneous measurements and multidevice testing.

Author
Chris Shaw

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