02/08/2017
RS Components has added the Tektronix TBS2000 series of digital storage oscilloscopes to its portfolio. According to the distributor, the TBS2000 captures and displays more signal than competitive units by featuring 10 vertical and 15 horizontal divisions.
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08/06/2017
The WTViewerE software from Yokogawa provides PC connectivity for the company’s power analysers – including the WT3000E, WT1800E, WT500 and WT300E models – via Ethernet, USB, GPIB or RS232 interfaces. This connectivity allows users to control, monitor, collect and analyse measurement data, and save measurements remotely.
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31/05/2017
Tektronix is adding products which offer a large differential voltage range and a higher input impedance to its IsoVu portfolio. IsoVu is an isolated measurement system with 120dB common mode rejection.
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21/04/2017
The LTC2358-18, an 18bit, 8channel simultaneous sampling successive approximation register (SAR) A/D converter from Linear Technology – now part of Analog Devices – features integrated picoamp input buffers.
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06/04/2017
METCASE has launched a range of aluminium enclosures for medical instruments, test and measurement, industrial control, peripherals, interfaces, switchboxes, communications and laboratory equipment.
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04/04/2017
Intersil has introduced five synchronous buck regulators that step-down 12V rails to point-of load inputs as low as 0.6V for MCUs, FPGAs, memory and peripheral I/Os.
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04/04/2017
Teledyne LeCroy has launched the HDO4000A, HDO6000A, HDO8000A, and MDA800A analogue and mixed-signal oscilloscopes, with bandwidths ranging from 200MHz to 1GHz.
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02/02/2017
Equivalent time automated compliance test solutions have been introduced by Tektronix for 4-lane 100G electrical interfaces defined in the IEEE 802.3bm and 802.3bj specifications.
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31/01/2017
The AFV-P series from Intepro Systems are precision, programmable AC/DC power sources.
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30/01/2017
The RT-ZPR20 is an extremely low-noise power rail probe with a bandwidth of 2 GHz. Developed by Rohde & Schwarz its 1:1 attenuation ensures very good sensitivity and a large offset range of ± 60 V permits analysis of the smallest disturbance signals during power integrity measurements, even on DC power supplies with a high voltage level.
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11/01/2017
With a diffraction grating based monochromator delivering high-precision measurement performance and accuracy, an enhanced user interface and an air purging feature, the AQ6374 from Yokogawa is a wideband optical spectrum analyser said to be a powerful benchtop tool for general purpose measurements over wavelengths ranging from 350 to 1750 nm.
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06/01/2017
Anritsu has launched a plug-in modular bit error rate (BER) tester for measuring a range of interfaces up to multichannel 64Gbit/s. Called the MP1800A, the device supports BER measurements of Optical Line Terminal (OLT) and Optical Network Unit (ONU) for the latest 100G-EPON standard.
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16/12/2016
As an extension of the Arbitrary/Function generators, Rigol Technologies is presenting the DG1022Z model: a multifunctional generator that enables a range of tests by combining multiple functions in one instrument.
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30/11/2016
The RSA7100A wideband signal analysis solution from Tektronix can store up to two hours of data from an 800MHz bandwidth feed. Covering frequencies ranging from 16kHz to 26.5GHz, the device is said to address a broad range of analysis needs.
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29/11/2016
Yokogawa Europe has unveiled the AQ7277B, a high-performance optical time-domain reflectometer (OTDR) module for use with remote fibre-test systems (RFTS).
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25/11/2016
A series of plastic packaged PIN diode control products has been launched by Microsemi. The devices are said to be cost effective and to provide higher RF functionality, enabling defence, aerospace and medical customers to drive down BOM costs with low risk and little sacrifice to performance.
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24/11/2016
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Anritsu has extended its Signal Analyser MS2840A series with the introduction of the MS2840A-051 Noise Floor Reduction and MS2840A-019 2dB Step Attenuator for millimeter-wave measurement.
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11/11/2016
A universal solution has been announced by Rohde & Schwarz which tests vehicle keys and the associated electronic control units with their various wireless technologies. With a modular and scalable approach, the system is said to test at the printed board and device level in all product phases - from development to product qualification to mass production.
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04/11/2016
A passive 1:1 probe from Rohde & Schwarz is said to broaden the application range of the company’s RTO and RTE series of oscilloscopes. Using the probe, engineers can measure to an accuracy of 1mV/div in applications such as power integrity.
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21/10/2016
Yokogawa has announced an upgrade to its lightweight AQ1300 series 1G/10G Ethernet multi-field tester.
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03/10/2016
Three axis MEMS accelerometers from Analog Devices are said to perform high resolution vibration measurement with low noise to enable the early detection of structural defects via wireless sensor networks.
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13/07/2016
A second-generation vector signal transceiver (VST) has been announced by National Instruments (NI). The PXIe-5840 module, said to be the world’s first 1GHz bandwidth VST, is designed to solve RF design and test applications.
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10/05/2016
Anritsu has introduced new options for its VectorStar and ShockLine vector network analyzers (VNAs) as it looks to address the test needs of signal integrity engineers.
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27/04/2016
National Instruments (NI) has released the NI PXIe-4081 7½-digit high-performance Digital Multimeter (DMM) and 1.8MS/s isolated digitiser. The NI PXIe-4081 is said to offer engineers the flexibility, resolution and isolation needed to tackle challenging applications that require smarter test systems in industries ranging from consumer electronics to aerospace and defence.
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15/03/2016
Tektronix has introduced the P7700 series of TriMode probes for use with Tektronix performance oscilloscopes. Claimed to offer up to 20GHz bandwidth, the probes are said to ease the challenges designers face when debugging circuits found in the latest mobile and enterprise designs by minimising probe loading, improving access to smaller, more-densely packed test locations and lowering overall cost of ownership.
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