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Test Smarter with NI PXI Scopes

National Instruments PXI oscilloscopes feature an open architecture and flexible, software-defined functionality to deliver unmatched versatility for both time- and frequency-domain applications. With an NI PXI oscilloscope, you get the out-of-the-box experience of a box instrument with a platform to support modern technology with both the measurement and channel capability to meet the changing needs of test and measurement.
Learn how PXI oscilloscopes are built for test.

Have You Considered a Modular Oscilloscope in Your Test System?

Whether it’s used to make a rise time measurement, measure a signal period, or identify peak-to-peak voltage, the oscilloscope has been an extremely valuable resource for test and measurement over the last 50 years. The oscilloscope is at the core of a variety of applications ranging from the test bench to rack-and-stack automated test systems. As application requirements and technology evolve, oscilloscopes have changed quite a bit since their invention and not all are created equal. New systems that use digital oscilloscopes to meet performance requirements have resulted in an acceptance of changes in oscilloscope specifications and features. With this evolution, have you considered how the recent trend toward modular instruments impacts this space?

If you haven’t considered a modular oscilloscope instead of your traditional box oscilloscope, ask yourself these questions:

  • How much space is required when combining multiple instruments to get the desired channel count?
  • How quickly will box oscilloscope components be obsolete or outdated?
  • How often do your measurement needs change?

Read this National Instruments article to gain more insight into the differences between box and modular oscilloscopes.

National Instruments

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