comment on this article

Seminar for Wireless UE (Handsets and Devices) 20th September, Winnersh

Agilent Technologies is pleased to invite you to our complimentary Wireless UE (Handsets and Devices) Symposium on Tuesday 20th September at Agilent Technologies, Winnersh

Join this unique symposium to discover how Agilent can help you solve the design and test challenges you face when developing tomorrow's advanced technologies. During the day, our technical presentations will focus on what is driving technology changes, advances in 3G and 4G technologies and test capabilities. This forum will educate engineers on the evolution of 2G/3G/LTE test standards, the implication this has for device testing, and new solutions to ensure design goals are met. The format for the forum is presentations and demonstrations by technology experts on technology advancements and corresponding test solutions.

As seating is limited, I encourage you to register at your earliest convenience. Refreshments and lunch will be provided. A confirmation package will be sent a few days before the event. We look forward to welcoming you to the seminar.

Why this Seminar is Important:
The complexity of modern devices is growing rapidly as wireless applications place demands on processing horsepower, battery performance, and data transfer speeds, on top of the traditional demands of designing to the latest RF and protocol standards. Ensuring a positive end user experience presents significant challenges for developers and test engineers.
What to Expect:
Expect a description of what is driving technology changes, advances in 3G and 4G technologies and test capabilities.

Who Should Attend:
Mobile phone designers, application developers, test engineers, and managers responsible for phone design, test, integration, or acceptance test.

Location and registration:
The seminar will take place at Agilent Technologies, 610 Wharfedale Road, Winnersh Triangle, Wokingham.


Tuesday 20th September
09:00 – 09:30 Registration and coffee
09:30 – 10:15 Paper #1: The Road to 4G IMT-Advanced and LTE-Advanced
10:15 – 11:15 Paper #2: Comms EDA solutions addressing new standards' design challenges
11:30 – 12:30 Paper #3: LTE to CDMA/UMTS InterRAT Testing
12:30 – 13:30 Lunch
13:30 – 14:30 Paper #4: Using antenna pattern measurement for flexible and cost-effective MIMO OTA characterization
14:45 – 15:45 Paper #5: Design and test Challenges of MIPI Digital interfaces like DigRF and D-PHY in the cellular industry
15:45 – 16:00 Summary and Close

Paper #1: The Road to 4G IMT-Advanced and LTE-Advanced
After much anticipation, the fourth generation (4G) of cellular wireless is nearly upon us. The ITU Radiocommunication sector (ITU-R) have been working on their IMT-Advanced 4G program for some time and are now soliciting candidate technologies from the industry later this year. 3GPP will be submitting LTE-Advanced, an enhancement to basic Release 8 LTE. This paper will explain the scope and timing of the ITU 4G programs and describe in some detail the major features of LTE-Advanced which will be standardized in Release 10 of the 3GPP specifications.

Paper #2: Comms EDA solutions addressing new standards' design challenges
LTE-Advanced is specified in 3GPP Release 10 and is now approved for 4G IMT-Advanced. This paper introduces key LTE-Advanced techniques, such as carrier aggregation, enhancement uplink clustered DFT-S-OFDM and enhancement MIMO scheme first. Then, the industry's first design library support for LTE-Advanced is reviewed, as part of the SystemVue platform. The LTE-Advanced library is shown, as well as LTE-Advanced downlink MIMO transmitter and receiver, LTE-Advanced Uplink MIMO transmitter and receiver, LTE-Advanced MIMO channel model, and applications for these reference designs for both simulation and hardware signal generation. Finally, measurements (such as CCDF, spectrum, PAPR, EVM and etc) and throughput on fading channel are also introduced.

Paper #3: LTE to CDMA/UMTS InterRAT Testing including Supplemental Compliance Test Requirements
LTE is an exciting technology which offers users the opportunity to benefit from a step change in the data throughput supported by their mobile devices. However this change cannot happen overnight as new technology requires new investment and a roll out of new infrastructure. In order to address this it is critical that LTE technology is able to interwork with existing c2k/UMTS infrastructure. This presentation begins with a brief summary of how a mobile device is able to maintain coverage and connectivity while it transitions between areas of LTE and legacy cell coverage. The paper then goes on to look at the requirements for testing this functionality. In particular the paper will describe the inter-RAT (Radio Access Technology) testing being done both for GCF conformance and as part of the Verizon compliance test requirements.

Paper #4: Using antenna pattern measurement for flexible and cost-effective MIMO OTA characterization
Several methods for measuring MIMO OTA performance are being considered by CTIA and 3GPP. Most rely on the creation of a spatially rich RF environment using either a reverberation chamber or anechoic chamber with multiple antennas. An alternative method is to split the characterization into two stages. In the first stage the device antenna pattern is measured in an anechoic chamber. The antenna pattern is characterized non-intrusively by the device measuring the amplitude and relative phase of a received signal from a know direction. In the second stage, the antenna pattern is convolved with any 2D or 3D channel model using a two channel fading emulator. The resulting signal is injected into the device receiver using the temporary antenna connector ports used for traditional conducted conformance testing. Importantly, this second stage does not require an anechoic chamber. There are several important advantages to the two-stage method of MIMO OTA characterization. It can reuse existing SISO OTA anechoic chambers of the type certified for SISO OTA and requires just one two-channel fading emulator which can precisely emulate any channel model. This provides the widest test coverage for very low cost. The method can be used to emulate the other test methods that create spatial channel models using multiple antennas or reverberation chambers. The two stage method requires support within the device chipset to measure amplitude and relative phase. It is not possible to measure device self-desensitization but this is substantially covered by existing SISO OTA tests.

Paper #5: Design and test Challenges of MIPI Digital interfaces like DigRF and D-PHY in the cellular industry
The mobile computing market is facing a technical revolution with the convergence on standardized high speed serial interconnects coexisting with proprietary interface between components within mobile devices. Bus standards defined by the Mobile Industry processor Alliance (MIPI) alliance are getting rapid adoption, such as the DigRF 0.60, 0.70, 1.00 , D-PHY CSI & DSI, used for connection between controller AP, BB-IC, RF-IC and Cameras and Displays. We will review typical physical and protocol domain test challenges associated with these technologies and will discuss how to efficiently debug, validate and integrate MIPI enabled devices.


Agilent Technologies UK Ltd

Comment on this article

This material is protected by MA Business copyright See Terms and Conditions. One-off usage is permitted but bulk copying is not. For multiple copies contact the sales team.

What you think about this article:

Add your comments


Your comments/feedback may be edited prior to publishing. Not all entries will be published.
Please view our Terms and Conditions before leaving a comment.

Related Articles

Lab on the Cloud

Renesas Electronics has expanded its Lab on the Cloud environment to simplify ...

One small step…

Stan Boland, CEO of Five, a leading UK self-driving start-up, talks about the ...

Change based testing

A major cause of software bugs is inefficient and incomplete testing. This ...

What is EMC testing?

Testing of products under EU guidelines to ensure they don't either pollute the ...

NI Trend Watch 2014

This report from National Instruments summarises the latest trends in the ...

DAQ µModule

Analog Devices (ADI) has introduced a 16-bit, 15 MSPS data acquisition mModule ...

T&M challenges

An interesting piece of research from Keysight Technologies shows that nearly ...

Finding its voice

The National Physical Laboratory (NPL) is the UK’s National Measurement ...