18 November 2009

Counterfdeit components and acoustic microscopy

This white paper from Alter Technology Group considers how the encapsulants used by semiconductor manufacturers may be identified and changes or variations detected - and will look in detail at encapsulants, and the potential hazards to system reliability.

The paper explains the principles of CSAM and illustrates how these are applied in nondestructive testing, failure analysis and how the CSAM compliments radiographic or x-ray inspection. The limitations of CSAM are also reviewed. The paper also describes the results of Alter UK's research to date into plastic encapsulants and suggests how this work may be taken forward in the fight against counterfeiters.

Author
John Jones

Supporting Information

Downloads
20788\WP Counterfeit Components and Acoustic Microscopy.pdf

Websites
http://www.altertechnology.com/

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