23 February 2010

Measuring absolute group delay of multistage converters using PNA microwave network analysers

This white paper from Agilent Technologies describes new calibration and measurement techniques for measuring absolute group delay of frequency converters with multiple mixing stages.

Author
 Agilent Technologies

Supporting Information

Downloads
22734\Measuring.pdf

Websites
http://www.agilent.co.uk/

Companies
Agilent Technologies UK Ltd

This material is protected by Findlay Media copyright
See Terms and Conditions.
One-off usage is permitted but bulk copying is not.
For multiple copies contact the sales team.

Do you have any comments about this article?


Add your comments

Name
 
Email
 
Comments
 

Your comments/feedback may be edited prior to publishing. Not all entries will be published.
Please view our Terms and Conditions before leaving a comment.

Related Articles

28nm cmos developments

Belgian research centre imec and Renesas Electronics have developed the first ...

Ultra sensitive image sensor

A new material discovered by researchers in Switzerland has been shown to ...

Image sensor on plastic

Plastic Logic has teamed up with French start up ISORG to develop the first ...

Pulling on precise power

As a rule, test and measurement companies need to be at the forefront of ...

Parametric prioritisation

The more complex our technical environment, the more advanced our measurement ...

Through thick and thin

Oscilloscope waveforms show real world electronic signals. How well the scope ...

Inductive sensing applications

This article considers a number of inductive sensing applications to give an ...

White space potentials

This white paper highlights the exciting new potential of white space.

Low power sensing

This article will look at how different types of resistive sensors operate and ...

SPDT rf switch

Peregrine Semiconductor has introduced of a new SPDT rf switch for harsh ...

AEC-Q100 qualified rf switch

Certified to AEC-Q100 standards, the new SPDT rf switch from Peregrine ...

RF to digital receiver

Linear Technology has announced the LTM9013, a wideband rf to digital µModule ...

RF & Wireless forum

25th June 2013, Williams F1 conference centre, Oxford, UK

Automated Test Summit 2013

27th June 2013, Royal Air Force Museum, Hendon, London

Agilent seminar

Tuesday 16th July 2013, Winnersh, UK

The networking challenge

A humorous look at a serious subject. Learn how Freescale's QorIQ platforms and ...

Ratiometric configuration

Learn what a ratiometric configuration is and how you can use it to increase ...

Analog temp sensor

Learn how analogue temperature sensors favorably compare with NTC thermistors ...

Patent trolls

Not only has the world become more litigious, it also seems to place more value ...

JTAG testing for everyman (and everywoman)

Believe it or not JTAG testing (the original purpose for the now venerable ...

The MicroTAC lingers on

Are you nostalgic for the mobile phones of yore, which weighed a lot, had ...

Roland Steffen, R&S

Graham Pitcher finds out from Roland Steffen how Rohde & Schwarz plans to build ...

Dr James Truchard, NI

After more than 30 years at the helm, Dr T tells Graham Pitcher he is still ...

Keith Attwood, ceo, e2v

Many UK based technology companies can trace their origins to the years ...