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ARM selects XJTAG

ARM is to use the XJTAG boundary scan development system to improve and speed the process of debugging and testing its RealView development hardware tools, which include high density multilayer development boards.


ARM is currently using XJTAG on its latest generation of RealView platform baseboards, which contain multiple high pin count bgas. Spencer Saunders, engineering manager, platforms, within ARM’s System Design Division, said: “With tens of thousands of pins on each board, we recognised that it would not be possible to validate these circuits in a commercially realistic timescale without the use of a boundary scan test system.”
XJTAG ceo Simon Payne said: “We are delighted that ARM has selected the XJTAG system. ARM engineers now have a boundary scan system that allows tests to be recorded, refined and repeatedly reused throughout the development cycle both by its in house team and by contract manufacturing partners.”
According to ARM, the XJTAG system has got test coverage up to 90% and allowed it to meet its 10minute per board boundary scan production test target. Production yields have also increased significantly.

Author
Graham Pitcher

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