14 June 2012 2012 Wireless Seminar 14th June 2012, Winnersh, UK The complexity of modern devices is growing rapidly as wireless applications place demands on processing horsepower, battery performance, and data transfer speeds, on top of the traditional demands of designing to the latest RF and protocol standards. Ensuring a positive end user experience presents significant challenges for developers and test engineers. This forum will educate engineers on the evolution of 3G/LTE/LTE-A test standards, the implication this has for device testing, and new solutions to ensure design goals are met. The format for the forum is presentations and demonstrations by technology experts on technology advancements and corresponding test solutions. What to expect: Expect a description of what is driving technology changes, advances in 3G and 4G technologies and test capabilities. Who should attend: Mobile devices designers, application developers, test engineers, group leaders and managers responsible for design, test, integration, or acceptance test. Contributor Agilent Technologies Comment on this article Websites http://www.home.agilent.com/agilent/eventDetail.jspx?cc=GB&lc=eng&ckey=2116373&nid=-536900813.536879285.08&id=2116373&cmpid=1-4254376024 Companies Keysight Technologies UK Ltd This material is protected by MA Business copyright See Terms and Conditions. One-off usage is permitted but bulk copying is not. For multiple copies contact the sales team. What you think about this article: Add your comments Name Email Comments Your comments/feedback may be edited prior to publishing. Not all entries will be published. Please view our Terms and Conditions before leaving a comment.