Home Advertise Magazine Events NETV Directory
  


Boundary scan controller for cabled PCI Express
November 2009 Email to a friend
 
Goepel electronic has introduced the Scanbooster/PEC, a high performance, low cost boundary scan controller.

Boundary scan controller for cabled PCI ExpressThe boundary scan controller is an addition to the company's Scanbooster product line and is compliant with the PCI Express External Cabling 1.0 Specification. It supports JTAG/Boundary Scan tests, VarioTAP emulation tests, ISP for PLD and fpga, as well as ISP for Flash serial EEPROM devices of moderate size.

The Scanbooster/PEC features two separate test access ports and supports a programmable TCK frequency up to 16MHz. Exchangeable TAP interface cards have been designed to make the controller flexible and future proofed. Test bus parameters such as output and input voltage as well as output and input impedance can be programmed independently for both TAPs.

As additional resources, the controller provides 32 voltage level programmable, dynamic Parallel I/O, two adc/dac channels, external trigger signals and three static I/O. Thus, the Scanbooster/PEC is ready to be deployed for extended test and PLD/Flash programming operations.

Test and ISP applications developed for the ScanBooster/PEC are cross-compatible with any controller of the ScanBooster series or the Scanflex Boundary Scan platform.

Optionally, GOEPEL electronic offers a plug in card as bridge for PCI Express to Cabled PCI Express. The distance between PC and Scanbooster/PEC can be up to 7m.

Scanbooster/PEC is fully supported by the Boundary Scan software System Cascon - the only completely integrated development environment with a powerful mixed signal programming language (CASLAN) for IEEE Std.1149.x, featuring more than 40 tools for automatic test program generation, pin fault diagnostics, VarioTAP emulation test, ISP, debugging, schematic and layout visualisation, and more.
 
Author
Chris Shaw
 
 
Supporting Information
http://www.goepel.com
 
This material is protected by Findlay Media copyright 2010.
See Terms and Conditions.
One-off usage is permitted but bulk copying is not.
For multiple copies contact the sales team.
 
Bookmark this article using:
 
Del.icio.us digg reddit Facebook StumbleUpon
 
 
Your comments / feedback
Do you have any comments or feedback on this article? Please contact us by filling in the form below.
NameHide name
Your Email Address
Comments
Send
We may edit your comments and not all entries will be published.
Terms and Conditions

To comment on news stories or blogs you need to complete our 60 second registration process. Once completed this then allows you to download any and all white papers, register for e-zines and access our detailed supplier directory for FREE.

If you are all ready a registered user then enter your e-mail address and login.

You will need to have logged in prior to entering your comments in the boxes provided.

Please enter your email address to login and gain free access to this site.
 
If you are using this site for the first time registration is quick and completely free.
 
Register Now - Register Now


Email Address :  

Remember Me: - If this box is ticked you will be automatically logged in when you return.

Important: To protect your privacy, do not select 'Remember Me' if other users have access to the computer you are using.

 
Related Companies
Goepel Electronics Ltd
 
 
Related News
Turnkey solution combines software and hardware for real time test applications
 
Educational platform lets students interact with circuits remotely
 
Handheld spectrum analyser has frequency coverage up to 43GHz
 
UKEA announces second ‘Anti Counterfeiting Forum’
 
Waveform generators deliver 'lowest jitter in class' says Agilent
 
 
Related Technology
Compound creativity
 
Targeting testability: Design for testability needs simple solutions
 
The changing face of emi compliance
 
System pulls its weight
 
Testing times for engineers
 
 
Related Products
Logic analyser brings digital, serial and analogue debug to the pc
 
Single source comprehensive SuperSpeed USB test suite
 
Boundary Scan fixture enables structural test of AMC modules for ATCA systems
 
Thermistor power meter and AC-coupled power sensor from Agilent
 
3D electromagnetic simulation software
 
 
Related Events
Vector GB Conference 2010