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Need for speed
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23/09/2008
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Responding to demand for faster data converters with higher resolutions, Texas Instruments has launched the first 16bit single channel, 200Msample/s a/d converter. The device, says TI, provides performance previously only available with lower resolution parts.
Fabricated using TI’s SiGe BiCom3 process, the ADS5485 can achieve a signal to noise ratio of 75dBFS and a spurious free dynamic range of 87dBc for a 70MHz input frequency.
Analogue front end design is said to be eased by the provision of a fully differential input buffer. This provides constant input impedance over input frequency and eliminates kickback from the a/d converter’s track and hold structure to ensure consistent signal linearity.
According to TI, the part enables 16bit resolution with up to 100MHz bandwidth for a range of test and measurement devices and general data acquisition systems. It also enables sampling of larger bandwidths in radar systems and allows software defined radios to implement a greater number of standards.
There will be five devices in the family, with conversion rates ranging from 80 to 200Msample/s, each supplied in a 9 x 9mm 64pin qfn.
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Author
Graham Pitcher
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