Boundary scan, as defined by IEEE1149.1, has proved invaluable for device programming and board level manufacturing test applications. However, some envision that its potential lies far beyond this, to connectivity testing, diagnostics and device programming at a system level.
Whilst using boundary scan chains to add system level capabilities isn’t new, there are some challenges to doing so. Designers can and do devise solutions for implementing system level boundary scan, but there’s no compatibility between solutions. One group hopes to change that.
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