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Bringing better insight
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25/02/2008
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With electronics components and the interfaces which link them together running at ever faster rates, testing the designs which take advantage of their features becomes increasingly complex.
But design today isn’t just about debug and similar processes. Here’s some of the issues which Agilent has identified. Higher data rates require interconnect analysis, low instrumentation error and high quality probes. The prevalence of fpgas means it’s harder to simulate overall performance, whilst evolving standards means measurement requirements are tighter and this often requires new test hardware. These various elements have one thing in common; they need a lot of data to be captured.
And that’s where acquisition memory comes in. Over the last few years, cheaper memory and more capable control schemes mean oscilloscopes have been equipped with more and more acquisition memory. But even scopes with the highest amount of acquisition memory have struggled to perform in the way their users would wish.
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Author
Graham Pitcher
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