New Electronics - For Electronic design engineers
 
   
Search :   Search Help    login

Sniffing out the bugs 04/01/2008
 
Trace debug tool , ETM/trace interfaces, Embedded Trace Macrocell (ETM), Embedded ICE (In Circuit Emulator), Jtag Until now, designers of ARM powered systems have been faced with the decision of whether a low cost Jtag debug interface would be sufficient for software development, or whether a more expensive emulator would be required.
There is no doubt that even the most powerful debug interfaces have reached their limits in attempting to support today’s standards, as well as being relatively expensive. For example, whilst considering the increase in execution speed enabled by pipelining and cache memory, a traditional emulator no longer allows monitoring of a processor core or its active program and memory contents. This is because processor clock frequencies have increased rapidly whilst debugger signal extraction is limited to 100MHz.
The new generation of ETM/trace interfaces provides a higher level of efficiency and functionality. These differ from a conventional Jtag probe in that they also offer a real time trace interface with a memory buffer – typically 1 to 2Mbyte – in which the most recent trace information is stored. This can be downloaded to a pc if an error or halt occurs in the program.
 
Author
Thomas Wagner
 
 
Download Articles
 
 Sniffing.pdf
 
This material is protected by Findlay Publications copyright 2008.
See Terms and Conditions.
One-off usage is permitted but bulk copying is not.
For multiple copies contact the sales team.
 
Supporting Information
 
 http://www.iar.com/
 
Email this article
 
News Item
Download Articles
 
 Sniffing.pdf
 
 
News Item
Linked Companies
 
 IAR Systems AB
 
 
News Item
Similar News Articles
 
  Tek targets ‘value’ sector
 
  Spend time to save time!
 
  Seeing is believing
 
  Agilent breaks the gigapoint barrier
 
  Hello, my friend! - Cover story
 
 
News Item
Similar Technology Articles
 
  The code enforcer
 
  Boxing clever
 
  Aerial views
 
  Focusing on flaws
 
  Bringing better insight
 
 
News Item
Related Industry Events
 
  Military and Aerospace Solutions