Space Enhanced Products in plastic packaging for your low Earth orbit spacecraft design

One of the more exciting aspects of the emerging new space market is the launch of high-volume low Earth orbit (LEO) satellites that are small and economically feasible, but also radiation-tolerant and reliable.

These satellites enable expanded communication and connectivity around the world. Unlike the traditional satellite market, where the majority of missions are in geosynchronous orbit up to 22,236 miles from Earth and expected to last more than 10 years, LEO satellites orbit much closer to Earth, not more than 1,300 miles away. Because they’re relatively easy to replace, they generally have mission lives for less than seven years.

The major challenges in electronic design for LEO satellites – all while meeting strict budgets and maintaining competitiveness – are:
• Using smaller, more integrated components to reduce board size.
• Finding devices with short lead times for quick-turn designs.
• Having electronic components capable of enduring the harsh conditions in space.

For designers new to the space market, there are specific challenges in space that products designed for terrestrial markets do not address, including:
• Radiation performance.
• Controlling process and material variations typical in commercial off-the-shelf (COTS) devices.
• Thermal cycling as satellites experience extreme temperature fluctuations as they move around Earth.
• Outgassing from plastic packages, which are not hermetically sealed.

TI’s Space Enhanced Product (EP) qualification process addresses these challenges and removes the need for high-risk and resource intensive upscreening methods sometimes used for this market. Upscreening is the practice of testing a part electrically or environmentally for use outside of datasheet specifications. While upscreening can help classify a device’s performance for space, there are still numerous risks and without a full understanding of the "recipe" of a device and its test vectors, this can lead to field failures and a false sense of security.

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